E-Assessment and Bring Your Own Device
New York, New York, USA / ACM Press (2017) [Abstract, Contribution to a book, Contribution to a conference proceedings]
[ITiCSE '17 Proceedings of the 2017 ACM Conference on Innovation and Technology in Computer Science Education]
Page(s): 373-373
Authors
Authors
Küppers, Bastian
Schroeder, Ulrik
Identifier
- DOI: 10.1145/3059009.3072994
- REPORT NUMBER: RWTH-2017-08454